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Welcome to Micro Burn-in & Technology, Inc.
Web Site.
Innovative Technology for Life-Test and Burn-in Systems.
The name " Micro Burn-in & Technology " makes the statement that this company is committedto the design, manufacture and operation of reliability test systems for electronic components. The founders and principles of Micro have decades of experience in supplying reliable and efficient burn-in and life testing systems and instruments to both component manufacturers and to users of high reliability components.
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As you peruse our website we invite you to discuss your reliability requirement with our technical and sales-engineering staff for comment and comparison to other requirements in the industry. Whether passive capacitors and resistors, or diodes, transistors, or I.C's Micro Burn-in has a solution for you. We have solutions for Voltage Conditioning, HALT, Weibull, Diode and Transistor HTRB and HTFB, Power Cycle / Thermal Fatigue. more....
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Life test and burn-in equipment
Life test and burn-in equipment includes systems and device fixturing techniques for assessing the quality or reliability of electronic components. The majority of this equipment line provides testing capability for all capacitor types to meet the appropriate military or industry specifications to qualify and maintain a product line or process.
High Temperature Reverse Bias (HTRB) systems for diodes and transistors are also included in this class of product. Forward power test systems for diodes and transistors are also available.
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ACOL Power Rectifier Burn-in Module
Up to 4 Amps of Forward Power and 1200 Volts of Reverse Voltage
Up to 1200 DUTs Capacity per System
48 Individual Controls
Click here for more information on ACOL System...
CE9051 - Capacitor Highly Accelerated Life Test
(Computer Monitored Leakage Current)
(To 250°C. For a 3 chamber system: 3 temperatures, 1200 DUTs/temperature)

CE2010 - Capacitor Burn-In and Life Test
(Manual, to 200°C, 1600 DUTs)

Model 2052 - Capacitor Highly Accelerated Life Test (Go/No-go)
(To 200°C, 1600 DUTs / Chamber, 3 chambers test 4800 DUTs total)

Model 2061 - Discrete Component Humidity Testing
(50 to +100°C, 30 to 98% RH, 1520 DUTs, computer controlled)

Model 7804 - High Voltage Capacitor Burn-In and Life Test

Model 2110 - Diode Burn-in, Life Test
High Temperature Reverse Bias (HTRB)
(To 200°C, 1600 DUTs)
Contact Us
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What is new.....
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We have moved,
Our new address:
920 S. Andreasen Dr. Suite 102
Escondido, CA 92029
MAP AND DIRECTIONS
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