Products & Services
With decades of experience with domestic and international projects, Micro has solutions and the experience to help you take it to the next level.
The following systems are also available with Computer Controlled capability:
Capacitors:
- HALT Systems, Chip and Leaded.
- Life Test and Burn-in Systems, Chip and Leaded.
- High Voltage Test Systems - 20,000 VDC or more, Chip and Leaded.
- High Voltage Test Systems - 20,000 VDC or more, Chip and Leaded.
- Intermittentcy Testing Systems, Chip and Leaded.
- Thermal Cycling Test Systems, Chip and Leaded.
Diodes:
- ACOL Burn-in Systems, Chip and Leaded.
Resistors:
- Resistor Burn-in Test Systems.
Semiconductors:
- TDDB Test Systems - up to 350 Degrees C.
- Electro-migration Test Systems - up to 350 Degrees C.
- Metal-migration Test Systems - up to 350 Degrees C.
- HAST Test Systems.
- Metal-migration Test Systems - up to 350 Degrees C.
- HAST Test Systems.
- Hot Carrier Test Systems.
- Prob Station Test Systems, TDDB, Hot Carrier and Electro-migration.
938 S. Andreason Dr., Suite F, Escondido, CA 92029 Office Voice: (760) 746-2010 Office Fax: (760) 746-0433
